UTOPIA - Automatic Generation of Fuzz Driver Using Unit Tests

Explore an innovative approach to automatic fuzz driver generation in this 14-minute IEEE conference talk. Learn how researchers from Samsung Research and Georgia Institute of Technology leverage unit tests to create UTOPIA, a system designed to enhance software testing efficiency. Discover the potential of this technique in improving fuzzing processes and uncovering software vulnerabilities. Gain insights into the methodology, implementation, and results of UTOPIA as presented by the team of experts from South Korea and the USA.

UTOPIA: Automatic Generation of Fuzz Driver using Unit Tests