Time of Flight-Secondary Ion Mass Spectrometry: Overview and Forensic Applications

Explore the powerful analytical technique of Time of Flight-Secondary Ion Mass Spectrometry (ToF-SIMS) and its diverse applications in forensic science in this 18-minute video presentation. Discover how this surface-sensitive method provides qualitative information and spatially resolved visualization of structures and trace chemical residues in complex forensic evidence. Learn about its successful implementation in analyzing toxicological samples, gunshot residues, fingerprints, hairs, glass, dyes, inks, questioned documents, and cosmetics. Gain insights into the technique's capabilities and its significance in forensic investigations, enhancing your understanding of advanced analytical methods in the field of forensic science.

Time Of Flight-Secondary Ion Mass Spectrometry: Overview And Forensic Applications | Paper 6