Poking Atoms With a Very Sharp Stick

Explore the fascinating world of Atomic Force Microscopy (AFM) in this 23-minute video. Learn about the principles behind AFM through a DIY "macro-AFM" demonstration, then witness a real AFM (nGauge AFM from ICSPI) in action with various scans. Discover how AFM complements Scanning Electron Microscopy (SEM) and excels in precise heightmaps, easy scanning, and diverse related techniques. Follow along as the video covers topics such as cantilever displacement sensing, tricky aspects of scanning probe microscopy, and MEMs scanners. Observe practical applications through scans of tungsten carbide inserts, ablated aluminum, and gage blocks, gaining insights into this powerful imaging technique used in scientific research and material analysis.

AFM Scans!
What is Atomic Force Microscopy?
DIY "Macro-AFM" and real AFM
Macro-AFM overview
Cantilever displacement sensing
Scanning on the Macro-AFM
Tricky aspects of scanning probe microscopy
Topographic result of lattice scan
Traditional AFMs are big
MEMs scanner on the nGauge
Scan: Tungsten Carbide insert
Scan: Ablated aluminum
Scan: Gage block
Conclusion