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Introduction to Transmission Electron Microscopy - Lecture 1

Offered By: nanohubtechtalks via YouTube

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Course Description

Overview

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Explore the fundamentals and advanced applications of Transmission Electron Microscopy (TEM) in this comprehensive 46-minute lecture by Nan Yao from Princeton University. Delve into the physics behind TEM, compare it with optical microscopes, and understand key components like electron guns, lenses, and sample holders. Discover how TEM enables visualization of structures from angstroms to microns, crucial for nanotechnology, nanobiotechnology, and nanomaterials characterization. Learn about recent advancements including aberration correction techniques, high-resolution imaging, and in-situ observations of atomic-scale phenomena. Witness practical demonstrations of TEM characterization of nanomaterials and gain insights into its relevance for undergraduate technical education in this NACK - Nano-Educators Topical Seminar Series presentation.

Syllabus

Introduction of Transmission Electron Microscope
Microscopy: the eyes and hands for nanotechnology
Imaging and Analysis Center Faculty Layout
Transmission Electron Microscopy
Physics of the Process
Single-cell algae
Pt catalyst particle
Jeol 100B TEM/VG HB5 STEM
Comparing with optical microscope
Then 2nd Gate to Microcosm
Electron microscope
Single and group dance performed by gold atoms
Microscopes in comparison
Key elements in a TEM
Electron Microscope Emission Sources
Some features of various electron guns
Electron Lenses
Electron Lens
Electron Lens
Magnetic Lens
Electron Microscope
Exploded view of the specimen goniometer stage
Sample holder
Transmission electron microscopy TEM
HR-TEM and Nano Diffraction of ordered twin boundary
Aberration Correction for Electron Microscope
Resolution and Aberrations
Spherical Aberration in Optical Lenses
Quadrupole-Octupole Type Cs Corrector
TEM-STEM Corrector Lens System
Initial Results from Aberration Correction in STEM
In Situ TEM Single-Atom-Thick Gold Nanoribbons Suspended in Graphene
Cs-C TEM Imaging and EDS mapping of QCL sample
CuInS2 photoconductivity and its defect structure


Taught by

nanohubtechtalks

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