Charged-Particle Interaction Analysis - From Optical Microscopy Limits to Advanced Electron Microscopy Techniques

Explore the fundamentals of Scanning Electron Microscopy (SEM) and related charged-particle interaction analysis techniques in this comprehensive 1 hour 48 minute seminar. Begin with an overview of optical microscopy limitations before delving into SEM components, including electron emission, electromagnetic lenses, and beam-sample interactions. Learn about various detection methods, image enhancement techniques, and advanced characterization tools like Energy Dispersive X-Ray Spectroscopy (EDS/EDX), Electron Probe Microanalysis (EPMA), and Electron Backscatter Diffraction (EBSD). Gain practical insights through interactive simulations, online tools, and a live demonstration of a Field Emission SEM. Suitable for beginners, this talk provides a solid foundation in micro/nano-characterization techniques and guides participants towards deeper understanding with supplementary materials.

Charged-Particle Interaction Analysis
Outline
Limits of Optical Microscopy
Limits of Optical Microscopy
Limits of Optical Microscopy
Limits of Optical Microscopy
Limits of Optical Microscopy
SEM: The Big Picture
SEM: The Big Picture
Electron Emission
Electron Emission
Electron Emission
Electron Emission
Electron Emission
Electron Emission
Electron Emission
Electron Emission
Electron Emission
Electromagnetic Lens
Electromagnetic Lens
Electromagnetic Lens
Electromagnetic Lens
Electromagnetic Lens
Electromagnetic Lens
Electromagnetic Lens
Electromagnetic Lens
Electromagnetic Lens
Electromagnetic Lens
Apertures
Apertures
Raster Coils
Raster Coils
Raster Coils
Raster Coils
Raster Coils
Noise Reduction
Stage
Beam Sample Interaction
Beam Sample Interaction
Beam Sample Interaction
Beam Sample Interaction
Beam Sample Interaction
Beam Sample Interaction
Beam Sample Interaction
Beam Sample Interaction
Beam Sample Interaction
Beam Detection
Beam Detection
Beam Detection
Beam Detection
Beam Detection
Beam Detection
Charging
Charging
Image Enhancement
Image Enhancement
Image Enhancement
Image Enhancement
Image Enhancement
Image Enhancement
Image Enhancement
Image Enhancement
Image Enhancement
Image Enhancement
Energy Dispersive X-Ray Spectroscopy EDS/EDX
Energy Dispersive X-Ray Spectroscopy EDS/EDX
Energy Dispersive X-Ray Spectroscopy EDS/EDX
Energy Dispersive X-Ray Spectroscopy EDS/EDX
Energy Dispersive X-Ray Spectroscopy EDS/EDX
Energy Dispersive X-Ray Spectroscopy EDS/EDX
Energy Dispersive X-Ray Spectroscopy EDS/EDX
Energy Dispersive X-Ray Spectroscopy EDS/EDX
Energy Dispersive X-Ray Spectroscopy EDS/EDX
Energy Dispersive X-Ray Spectroscopy EDS/EDX
Energy Dispersive X-Ray Spectroscopy EDS/EDX
Electron Probe Microanalysis EPMA
Electron Probe Microanalysis EPMA
Electron Probe Microanalysis EPMA
Electron Probe Microanalysis EPMA
Electron Probe Microanalysis EPMA
Electron Probe Microanalysis EPMA
Electron Probe Microanalysis EPMA
Electron Probe Microanalysis EPMA
Electron Probe Microanalysis EPMA
Electron Probe Microanalysis EPMA
Electron Probe Microanalysis EPMA
Electron Backscatter Diffraction
Electron Backscatter Diffraction
Electron Backscatter Diffraction
Electron Backscatter Diffraction
Electron Backscatter Diffraction
Electron Backscatter Diffraction
Electron Backscatter Diffraction
Electron Backscatter Diffraction
Electron Backscatter Diffraction
Electron Backscatter Diffraction
Electron Backscatter Diffraction