Improving the Reliability of Next Generation SSDs Using WOM-v Codes

Explore a 14-minute award-winning conference talk from FAST '22 that delves into enhancing the reliability of next-generation Solid State Drives (SSDs) using WOM-v Codes. Learn about the challenges faced by high-density SSDs, particularly QLC drives, which offer increased storage capacity but suffer from significantly lower Program and Erase (P/E) cycles. Discover the innovative design and implementation of non-binary, Voltage-Based Write-Once-Memory (WOM-v) Codes aimed at improving the lifetime of QLC drives. Gain insights into the development of a FEMU-based simulator test-bed for evaluating WOM-v code gains on real-world workloads. Understand two key optimizations: an efficient garbage collection mechanism and an encoding optimization that significantly enhance WOM-v code endurance without compromising performance. Examine the results of careful evaluation, including microbenchmarks and trace-driven assessments, which demonstrate how WOM-v codes can reduce Erase cycles for QLC drives by 4.4x-11.1x in real-world scenarios, ultimately leading to improved QLC SSD lifetime with minimal performance overhead.

FAST '22 - Improving the Reliability of Next Generation SSDs using WOM-v Codes