Measurement Induced Criticality in Monitored Quantum Systems

Explore the cutting-edge research on measurement-induced criticality in monitored quantum systems in this comprehensive lecture by Ehud Altman at ICBS2024. Delve into the novel role of measurements in quantum devices, examining how they actively prepare system states rather than merely diagnosing them. Investigate the non-local impact of quantum collapse on entangled states, leading to phenomena such as measurement-induced criticality and universal structures in post-measurement wave-functions. Review recent advancements in understanding these phenomena through mappings to effective statistical mechanical models. Address the challenges of experimentally diagnosing post-measurement correlations, considering their dependence on measurement outcomes with low Born probability. Discover a innovative approach to overcome the post-selection problem by cross-correlating experimental data with classical computation results.

Ehud Altman: Measurement induced criticality in monitored quantum systems #ICBS2024