Techniques of Material Characterization
Offered By: Indian Institute of Technology, Kharagpur via Swayam
Course Description
Overview
Syllabus
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Introduction to microscopy
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Basic principles of image formation
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General concepts of microscopy: resolution. Magnification, depth of field, depth of focus etc.
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Optical microscopy
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Image formation, contrast development
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Basic components (light sources, specimen stage, lens system, optical train etc.)
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Various modes of optical microscopy
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Bright field mode (transmission vs. reflection)
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Contrast enhancing modes (dark field, polarized light, interference contrast, fluorescent microscopy etc.)
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General concepts of electron microscopy
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Basic components of electron microscope (electron gun, electro-magnetic lenses etc.)
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Aberrations (chromatic, spherical, astigmatism etc.) and their corrections
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Electron-materials interaction (elastic vs. inelastic scattering, coherent vs. incoherent scattering, interaction volume)
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Transmission electron microscopy (TEM)
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Image formation and contrast generation (mass-thickness contrast, atomic number contrast, diffraction contrast etc.)
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Modes of TEM (bright field, dark field, HAADF, STEM)
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Electron diffraction in TEM
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Scattering of electrons in crystalline material (Braggs law, zone axis, order of diffraction etc.)
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Electron diffraction in TEM
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Concept of reciprocal lattice, Ewald sphere, diffraction from finite crystal
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Diffraction pattern (Single crystal vs. polycrystalline diffraction, selected area diffraction etc.),
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Indexing of diffraction pattern (camera constant, structure
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Application of electron diffraction (DF imaging, dislocation contrast, phase identification etc.)
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Scanning electron microscopy (SEM)
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Working principle in scanning mode
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Signal generation: Inelastic scattering (Secondary vs. backscattered electron, Auger electrons, characteristic X-ray emission etc.)
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Basic components of SEM
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Detectors: SE (E-T detector), BSE (scintillator vs. solid state), in-lense detector
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Optics of SEM (magnification, pixel, resolution, depth of field)
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Resolution in SEM (minimum probe size, beam current etc.)
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Chemical analysis in SEM
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EDS and WDS detectors
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Imaging and contrast generation in SEM
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Topographic imaging (in SE & BSE mode)
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Compositional imaging (BSE mode)
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X-ray production
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Electromagnetic radiation, continuous spectrum, characteristic spectrum
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X-ray absorption (adsorption edge, excitation voltage, Auger effect etc.), X-ray filters
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ntensities of diffracted beams
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Scattering by single electron (Thomson and Crompton scattering)
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Scattering by single atom: atomic scattering factor
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Intensities of diffracted beams
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Scattering from unit cell: structure factor calculation for various crystal systems
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Multiplicity factor and temperature factor
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X-ray diffraction profile and analysis
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FWHM and line broadening
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Crystallite size effect and Scherrer formula
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Effect of strain (tensile vs compressive, uniform vs. non-uniform)
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Amorphous vs. crystalline materials
Taught by
Prof. SHIBAYAN ROY
Tags
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